Analysis of materials and surfaces with imaging mass spectrometry

Do you want to know what is causing discolorations on your surface? Or know more about your newly developed material? RISE offers unique expertise and equipment for molecular analysis of surfaces and materials with Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), from smaller analysis assignments to longer research and development collaborations. With ToF-SIMS we can measure very low amounts of sample and imaging specific molecules, including organic ones, at very high spatial resolutions, something that is not possible with other analytical methods. With our long experience in answer questions about surfaces and materials in a variety of industrial areas, we have unique expertise to answer your specific question.

Examples of questions and analysis tasks we can help with are: 

• Problem solving for manufacturing industry in various areas, e.g.
  • adhesion problems
  • discoloration
  • coatings
  • cleaning / contamination problems
• Characterization of advanced / composite materials for examining the spatial distribution of components, e.g.
  • additives in polymers
  • surface coatings or layered materials
  • functionalized surfaces
  • pharmaceutical formulations (for example, tablets)
  • batteries
• Analysis of complex natural materials, e.g.
  • biological tissues
  • geological samples
  • paper and wood
• Chemical analysis of particles
  • single particles down to 10-100 µm diameter can be analyzed