Contact person
Kristina E Lindgren
Forskare
Contact Kristina EWe have the possibility to characterise the surface, crystal structure and composition of most types of organic and inorganic materials such as metals, ceramics and polymers using Scanning Electron Microscopy (SEM) in combination with Energy Dispersive X-Ray Spectroscopy (EDS/EDX) and Electron Backscattered Diffraction (EBSD).
At RISE we have several scanning electron microscopes that are suitable for different types of materials and analyses. In addition to materials characterisation, we offer services within product and process development, as well as fault and failure analysis of industrial applications.
Field Emission (FE)-SEM gives unique possibilities to examine the surface structure of materials at very high magnification with resolution. With Low Vacuum (LV)-SEM imaging and analysis of all types of solid materials is possible, often after very simple specimen preparation. In addition, we can perform quantitative elemental analysis and crystallography with high precision using EDS and EBSD.
We perform both consultant services and advanced research projects for the manufacturing and product development industries, using some of the best analysis equipment in combination with our broad knowledge and experience.
Energy Dispersive X-Ray Spectroscopy (EDS) is an effective technique for elemental analysis. The method is simple, quick and (most often) non-destructive. In a few seconds it is possible to get information about what elements there are in a material and their approximate concentration. By analysing during a longer time, the precision of the measurement is improved successively, which can be of interest for calculation of the relative material composition.
Electron Backscattered Diffraction (EBSD) gives crystallographic information in each analysed point, such as crystal structure, phases present, crystal/grain orientation, etc. In addition, evaluation of the acquired data can show local deformation, average grain size and grain size distribution, grain boundary analysis, etc. Because this analysis method is diffraction based, the material needs to be crystalline and have high enough density. EBSD is especially suitable for studying materials/alloys that exhibit allotropic phases, i.e. phases with different crystal structure but with the same chemical composition.
Product datat sheet SEM (pdf, 458.25 KB)
Product datat sheet EDS (pdf, 986.01 KB)
Product datat sheet EBSD (pdf, 723.77 KB)
Product datat sheet BIB (pdf, 1009 KB)