Contact person
Peter Sjövall
Forskare
Contact PeterBy using ToF-SIMS, we can provide molecular information about material surfaces and image the spatial distribution of different components. All solid materials can be analyzed, but the method is particularly powerful for organic compounds. Very low sample quantities are required for the analysis and specific molecules can be imaged at high spatial resolutions, at a level of detail and sensitivity that is not possible with other analytical methods.
RISE offers unique expertise and equipment for molecular analysis of surfaces and materials with Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), from smaller analysis assignments to longer research and development collaborations. With our long experience of solving problems in a variety of industrial areas, we plan and execute the analyses, together with you, and interpret and evaluate the results based on the specific question. Examples of questions and analysis tasks we can help with are:
ToF-SIMS
2000
Laboratory testbeds (LT)
Automotive and transport, Buildings and infrastructure, Education, Energy and Clean Tech, Health and Life Sciences, ICT and Telecom, Food and agriculture, Manufacturing, Materials, Mining and metal, Process industry, Pulp, paper and packaging, Retail, Security and defence, Other
Material transition
Västra Götaland Region