Göran Wetter

Forskare

Tel

Location

Mölndal

Failure analysis of electronics, Materials analysis, Optical Microscopy, Microfocus X-ray inspection, Scanning Electron Microscopy (SEM), Scanning Acoustic Microscopy (SAM)

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Ask me about

Project

Failure Analysis 4.0

The goal of Failure Analysis 4.0 was to develop smart AI based tools for a mostly automated process chain for failure diagnostics integrating self-learning data analysis and defect detection and localization, standardized material…

Expertise

Material & failure analysis electronics

The extreme pace of development within materials and technology brings with it a large risk of mistakes and problems during electronics manufacturing. Failures that are not discovered in time can become very expensive. It is there…