Contact person
Niklas Nordgren
Projektledare
Contact Niklas
Atomic Force Microscopy (AFM)
Atomic Force Microscopy (AFM) allows for studying nanoscale surface and interfacial properties of your product or application. For example, surface morphology, topography, nanomechanical surface properties, intermolecular and surface forces, adhesion, nanotribology i.e. friction, lubrication and wear.
Purpose
Properties and behavior at the micro- and nanoscale influence the performance of your product or application. By utilizing AFM-techniques and our extensive knowledge in the field we can support you in research and development processes.
Method
RISE offer different types of AFM-techniques depending on your needs and the materials/surfaces and/or interfacial properties to be studied:
Nano Mapping of Surface Properties
- Surface morphology, topography and roughness.
- Nanomechanical surface properties (e.g. dissipation, adhesion, modulus, deformation).
- Electrical surface properties (i.e. mapping of conductivity).
- Surface potential mapping (Kelvin probe force microscopy).
Nano Indentation and nano scratching
- Contact mechanics and wear resistance.
AFM – Colloidal Probe Technique
- Intermolecular and surface forces between different materials at the micro- and nanoscale.
- Nanotribology (friction, lubrication and wear).
Deliveries
After the end of the project the results will be delivered according to the agreed method described in the quotation. For example, as a report or presentation and a meeting to discuss continuation projects.