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In-situ scanning electron microscope
The in-situ SEM is a unique and cutting-edge advanced analytical technique to investigate microstructrutal properties. The technique can be used to explore new sustainable processes that will lead to a lower carbon footprint.
Purpose
The in-situ scanning electron microscope (SEM) is a state-of-the-art instrument used for characterisation of materials as they undergo changes from high temperature and chemical changes due to a reactive gas atmosphere (such as hydrogen, carbon dioxide, or air). This unique ability makes the in-situ SEM a critical instrument for investigations of high temperature phenomena such as iron reduction, calcination, and carbon black formation.
Method
RISE's in-situ SEM is equipped with number of advanced detectors such as Energy Dispersive X-ray spectroscopy (EDX), in-lens detectors for secondary and backscattered electron detection and Scanning Transmission Electron (STEM) detector. The SEM can be operated from low voltage 0.2 keV up to 30 keV.
The in-situ heating experiments can be carried out in high vacuum and at high temperature with and without a reactive environment.
Delivery
Delivery will often include images or videos of the samples as they undergo thermal or chemical changes, included in a report detailing the microstructural characterisation. Results from advanced detectors such as EDX or scanning transmission may also be included depending on the nature of the characterisation.